作者：石小容, 伍川辉, 靳行
作者单位：西南交通大学机械工程学院, 四川 成都 610031
关键词：高速列车; 温湿度; 舒适性; STM32处理器
摘要：
为了解列车运行时客室内温湿度的动态变化以及该变化对乘客舒适性的影响,研究设计一种便携式温湿度舒适性实时测试系统。通过在高速列车实测温湿度数据和乘客调查问卷的统计分析基础上,给出适用于我国高速列车的温湿度舒适性评价指标。系统以STM32系列处理器和数字式温湿度传感器SHT21为核心,采用模块化设计,由电源模板、温湿度测量模块、存储模块和LCD显示模块组成。实验表明该系统可满足高速列车客室内温湿度动态变化及乘客温湿度舒适性的测试要求。
Research of portable temperature and humidity comfort tester
SHI Xiao-rong, WU Chuan-hui, JIN Hang
College of Mechanical Engineering, Southwest Jiaotong University, Chengdu 610031, China
Abstract: In order to know the dynamic change of the temperature and humidity in the passenger compartment when the train running and the impact of the change on passenger comfort, a portable real-time temperature and humidity comfort test system was designed. A comfort evaluation index of temperature and humidity which is suitable for our country's high-speed train was given by measuring temperature and humidity data and statistical analysis of passenger questionnaire. The system is designed with STM32 processor and digital temperature and humidity sensor SHT21 as the core. It adopts modularizing design including power supply module, temperature and humidity measurement module, storage module and LCD display module. Experimental results show that the system can satisfy the test requirements both in dynamic change of temperature and humidity, and the comfort test of passengers in the high-speed train compartment.
Keywords: high-speed train; temperature and humidity; comfort; STM32
2014, 40(1): 69-72,96 收稿日期: 2013-3-15;收到修改稿日期: 2013-5-17
基金项目: "十一五"国家科技支撑计划(2009BAG2A01)
作者简介: 石小容(1980-),女,四川泸州市人,硕士研究生,专业方向为自动测试与PC仪器。
参考文献
[1] 卢津,赵洪全,许广东. 铁路客车舒适度的检测与评价[J].中国铁路,2004(6):26-29.
[2] 俞展猷. 铁道车辆舒适性评价方法的发展与研究现状[J].铁道车辆,2004(3):1-7.
[3] 王永虹,徐炜,郝立平. STM32系列ARMCortex-M3微控制器原理与实践[M]. 北京:北京航天航空大学出版社,2008.
[4] 周立功. ARM嵌入式系统基础教程[M]. 北京:北京航空航天大学出版社,2005.
[5] GB/T 18204.13-2000公共场所空气温度测定方法[S].北京:中国标准出版社,2000.
[6] GB/T 18204.14-2000公共场所空气湿度测定方法[S].北京:中国标准出版社,2000.
[7] 杨亮. 旅游目的地舒适度评价指标体系的建立和评价方法的研究[J]. 山东经济,2008(5):68-73.
[8] 刘转华,林建辉. 列车乘坐舒适性与平稳性测试及评价[J].中国测试技术,2004,30(2):39-40.
