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低压差线性电压调整器噪声电压测试方法

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作者:罗军, 刘焱, 王小强, 罗宏伟

作者单位:工业和信息化部电子第五研究所, 广东 广州 510610


关键词:低压差线性电压调整器;噪声谱密度;噪声电压;测试方法


摘要:

低压差线性电压调整器在便携应用中除需要实现电压转换功能外,还必须满足专用电路的噪声要求。噪声电压作为低压差线性电压调整器的关键指标之一,它限制电路能够处理的最小信号电平。为适应新型低压差线性电压调整器的低噪声测量需求,该文提出采用电池供电与实时信号分析仪相结合的噪声电压测试方法,该方法通过降低低压差线性电压调整器输入噪声对输出噪声的影响,具有测量精度较高、测试灵活、平台搭建简单等特点。文中对比分析采用直流电源供电与采用电池供电的噪声电压测试方法,实验结果表明:采用电池供电的噪声电压测试方法可以满足10 V量级的噪声电压测试需求,达到对低压差线性电压调整器噪声电压进行准确考核的目的。


Noise voltage testing method of low dropout linear regulator

LUO Jun, LIU Yan, WANG Xiaoqiang, LUO Hongwei

CEPREI, Guangzhou 510610, China

Abstract: In addition to realizing the function of voltage regulating, the low dropout linear regulator(LDO) shall also meet the noise requirement for specific circuit in portable applications. As a key indicator of LDO, noise voltage limits the minimum signal level that can be processed by the circuit. To meet the requirement of low noise measurement of a new LDO, a noise voltage testing method using real time analyzing(signal analyzer) and battery powering is proposed. The presented method can reduce the effects of input noise of LDO on output noise and has the advantages of high measured accuracy, flexible testing and simple platform constructing. Two noise voltage testing methods, direct-current powering and battery powering, are compared in the paper. Results show that the presented method can measure low noise voltage whose level ups to 10 μV, so that it can reach the goal of precise evaluation of low noise voltage of LDO.

Keywords: low dropout linear regulator;noise spectral density;noise voltage;testing method

2017, 43(11): 22-25  收稿日期: 2017-06-12;收到修改稿日期: 2017-07-09

基金项目: 

作者简介: 罗军(1986-),男,湖南衡南县人,工程师,主要从事集成电路检测、信号处理等相关工作。

参考文献

[1] 刘远,吴为敬,李斌,等. 非晶铟锌氧化物薄膜晶体管的低频噪声特性与分析[J]. 物理学报,2014,63(9):098503.
[2] ZHI H Q, XIAO M Z, YI S D. A methodological approach to fault location of IC modules[C]//Proc 15th World Conference on Non-Destructive Testing. Rome:Via A Foresti,2000.
[3] JONES B A, XU Y Z. Excess noise as an indicator of digital integrated circuit reliability[J]. Microelectronics Reliability,1991,31(2/3):351-361.
[4] 尚斌,罗军,蔡志刚,等. 低压差线性电压调整器电源纹波抑制比测试方法[J]. 中国测试,2017,43(5):15-19.
[5] RAVEESH M R. Design techniques for ultra-low noise and low power low dropout regulators[D]. Phoenix:Arizona state university,2014.
[6] 杨寒冰,李学建. 一种低噪声LDO的设计[J]. 机电工程技术,2016(Z2):295-298.
[7] 邹静,杨维明,蒋师,等. 一种低噪声高PSRR的LDO线性稳压器[J]. 湖北大学学报(自然科学版),2012,34(3):360-364.
[8] 阴亚东,阎跃鹏. 一种低噪声高电源抑制比CMOS低压差线性稳压器[J]. 固体电子学研究与进展,2013,33(6):571-576.
[9] 温晓珂,谈熙,闵昊. 用于射频SOC芯片的低噪声高电源抑制比LDO[J]. 固体电子学研究与进展,2011,31(3):274-279.
[10] JIANG P W, JIN Q J, XI F Z. Less occupied and ultra-low noise LDO design[J]. Analog Integration Circuit Signal Processing,2014(81):453-459.
[11] 钱志鸿. 集成电路噪声模型算法及其矩阵表达[J]. 东北师大学报(自然科学版),2003,35(2):41-46.
[12] 朱勤为,唐宁,吴鹏,等. LDO低输出噪声的分析与优化设计[J]. 电子器件,2009,32(5):875-879.