作者：董世运, 李浩宇, 徐滨士, 朱学耕

作者单位：装甲兵工程学院装备再制造技术国防科技重点实验室, 北京 100072

关键词：HT250;衰减系数;探头频率;晶片尺寸

摘要：

HT250材料目前在很多行业中有广泛的应用,为探究其在超声探伤中的衰减性,利用一组参数不同的直探头测定HT250和45钢的衰减系数。检测结果表明:1)HT250衰减系数大于45钢。2)探头频率和晶片尺寸均影响着衰减系数大小。开展模拟实验分析它们对衰减系数的影响,模拟结果表明:提高探头频率使衰减系数增大,频率越高增幅越大;探头晶片尺寸增大使衰减系数减小,且探头晶片尺寸对衰减系数影响弱于频率。

Exploration of HT250 material's attenuation property in ultrasonic flaw inspection

DONG Shiyun, LI Haoyu, XU Binshi, ZHU Xuegeng

State Key Lab. of Remanufacture, Armored Force Engineering Institute, Beijing 100072, China

Abstract: HT250 materials have been extensively applied in many industries lately. To explore their attenuation property in ultrasonic flaw detection, a group of normal probes with different parameters are used to measure the attenuation coefficient of HT250 and steel 45^#. The testing results indicate:1)attenuation coefficients of HT250 are greater than those of steel 45^#; 2)the attenuation coefficients are impacted by probe frequency and wafer size. Their influence on attenuation coefficient is analyzed through simulation tests. Simulation results show that the attenuation coefficient increases as probe frequency increases but reduces as the wafer size enlarges, and the wafer size has smaller effect on the attenuation coefficient than the probe frequency does.

Keywords: HT250;attenuation coefficient;probe frequency;wafer size

2016, 42(3): 123-127  收稿日期: 2015-03-21;收到修改稿日期: 2015-04-17

基金项目: 国家自然科学基金项目(50975287)国家973计划项目(2011CB013405)

作者简介: 董世运(1973-),男,山东曹县人,副研究员,博士,主要从事无损检测与评估、再制造技术与质量控制等方面的研究。

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