您好,欢迎来到中国测试科技资讯平台!

首页> 《中国测试》期刊 >本期导读>一种基于信息流模型的故障隔离方法

一种基于信息流模型的故障隔离方法

2272    2016-01-23

免费

全文售价

作者:陈圣俭1, 王栋1,2, 丁岩松1

作者单位:1. 装甲兵工程学院控制工程系, 北京 100072;
2. 中国航天员科研训练中心, 北京 100094


关键词:信息流模型; 测试性设计; 故障隔离; 非多余测试; 划分


摘要:

为了实现快速地故障隔离,提出了一种基于信息流模型和测试划分的故障隔离方法。首先计算出非多余测试,在信息流模型中,具有相同激励的测试可以同时被执行,并按此对测试进行分组。在故障隔离过程中,按各组能检测出的故障出现概率的大小来决定测试顺序。实验表明,该方法最大程度地减小了测试时间,同时兼顾考虑了故障出现的概率和最少测试硬件增加。


Fault isolation method based on information flow model

CHEN Sheng-jian1, WANG dong1,2, DING Yan-song1

1. Department of Control Engineering, Armored forces Engineering University, Beijing 100072, China;
2. Center of Astronaut Scientific Research and Training of China, Beijing 100094, China

Abstract: An algorithm based on information flow model and test partition was proposed to achieve fast fault isolation strategy. Firstly, non-excess tests should be computed. In the information flow model, different tests could be grouped according to their stimulant, because tests with the same stimulant could be carried out at the same time. The sequence of tests could be decided by the probability of fault conclusion detected by these test groups in the course of fault isolation. Experimental results indicated that with this algorithm, test time could be decreased as much as possible. At the same time, the fault probability and the minimal test hardware had been taken into consideration.

Keywords: Information flow model; Testability design; Fault isolation; Non-excess test; Partition

2008, 34(4): 52-54  收稿日期: 2007-11-27;收到修改稿日期: 2008-2-9

基金项目: 

作者简介: 陈圣俭(1967-),男,山东济宁人,教授,博士后,主要研究方向为智能BIT、故障诊断。

参考文献

[1] Simpson W R, Sheppard J W. System test and diagnosis[M]. Boston:Kluwer Academic Publishers, 1994:65-86.
[2] 温熙森, 徐永成, 易晓山, 等.智能机内测试理论与应用[M].北京:国防工业出版社, 2002:54-66.
[3] Dill H. Test program sets-a new approach[C]. IEEE Autotestcon, 1990:63-69.
[4] 王栋, 陈圣俭. 基于信息流模型的测试选择方法[C]. 上海:同济大学全国博士生学术论坛(同济大学)控制分论坛, 2007.
[5] 田仲, 石君友.系统测试性设计、分析与验证[M].北京:北京航空航天大学出版社, 2003:41-57.
[6] 甘茂治, 唐建设, 高崎.军用装备维修工程学[M].2版. 北京:国防工业出版社, 2005:193-200.
[7] Simpson W R, Sheppard J W. Dependency modeling pitfalls[C]. IEEE Autotestcon, 1994:717-720.
[8] 曾天翔.电子设备测试性及诊断技术[M].北京:航空工业出版社, 1996.
[9] Simpson WR, Sheppard J W. System testability assessment for integrated diagnostics (part 3)[J]. IEEE Design and Test of Computers, 1992, 9(1):40-54.
[10] 黎琼炜, 易晓山, 刘冠军.系统级故障隔离的间接熵法[J]. 系统工程与电子技术, 2001, 23(2):51-54.
[11] 丁定浩. 可靠性与维修性工程-系统与电路结构的分析和设计[M].北京:电子工业出版社, 1986:345-349.