作者：闫军, 高峰

作者单位：北京出入境检验检疫局, 北京 100029

关键词：原子荧光光谱法; 家电产品; 铬(Ⅵ); 方法研究

摘要：

本方法应用原子荧光光谱法测定电子电气产品中铬(Ⅵ)的含量,为了适应RoHS中各种复杂样品的检测以及改善样品消解等诸多实际问题,本文进行了研究。其相对标准偏差(RSD):2.03%;检出限:0.0646mg/L;线性范围宽,校准曲线的线性相关系数应大于0.999等。有效地将铬(Ⅵ)与铬(III)分离,并有效地消除基体干扰等,完全能够适应电子电气产品中铬(Ⅵ)的测定。

Atom fluorescence spectrum application research for Cr(Ⅵ) determination of domestic electron products

YAN Jun, GAO Feng

Beijing Enit-Extry Inspction and Quarantine Bureau, Beijing 100029, China

Abstract: In order to satisfy the measurement requirements of various complicated RoHS samples, improve sample digesting, and resolve a lot of other actual problems, atom fluorescence spectrum method was applied to determine the chromium(Ⅵ) contents of domestic electron products. The relative standard deviation (RSD) of this method was 2.03%, the limit of detection was 0.006 4 mg/L, the linear correlation coefficient of the calibration curve was larger than 0.999 and the linear range was much wider. Also, the responses of chromium(Ⅵ) and chromium(Ⅲ) could be separated and the matrix interferences could be reduced efficiently. Thus, this method could be used to determine chromium(Ⅵ) in electron products.

Keywords: Atom fluorescence spectrum method; Electron products; Chromium(VI); Investigation

2008, 34(6): 113-117  收稿日期: 2007-9-5;收到修改稿日期: 2007-10-24

基金项目: 

作者简介: 闫军(1959-),男,副主任技师,研究方向:微量元素及光谱法分析等。

参考文献

[1] 闫军, 高峰, 刘霁欣.蒸汽发生-原子荧光法测定电子电气产品中的Cr(Ⅵ)[J].现代仪器, 2006(2):43-45.
[2] SJ/T 11365-2006, 电子信息产品中有毒有害物质的检测方法[S].信息产业部, 2006.