作者：孙志旺, 梁玉英, 潘刚, 张国龙, 李伟
作者单位：军械工程学院电子与光学工程系, 河北 石家庄 050003
关键词：电冲击; 加速退化试验; 伪失效寿命; 可靠性评估
摘要：
为探究电冲击对电子装备寿命的影响,选取电源通断瞬间产生的高压为电冲击加速应力,并以雷达某系统功能电路板为研究对象,开展电应力加速退化试验。通过对试验数据的统计分析,得到基于性能退化轨迹的伪失效寿命,并在Weibull分布条件下进行参数估计,提出基于电应力的电源开关通断电加速模型,并实现对某型雷达功能电路板的可靠性评估。
Research on electrical-stress accelerated degradation test technique and reliability assessment method
SUN Zhi-wang, LIANG Yu-ying, PAN Gang, ZHANG Guo-long, LI Wei
Department of Electronic and Optical Engineering, Ordnance Engineering College, Shijiazhuang 050003, China
Abstract: In order to explore the impact of electric shock to electronic equipment lifetime, high voltage which generates instantaneously in switching power was selected as the accelerated stress of electric shocks and accelerated degradation test was conducted taking PCB of certain type radar as the experimental subject. The pseudo-failure lifetime based on analysis of degradation path of performance degradation was obtained by the experiment, and parameter estimation was carried out in the Weibull distribution. The acceleration model under the power on-off mode based on electrical-stress was proposed, and an example of a radar circuit board was provided to complete reliability assessment of electronic products.
Keywords: electric shock; accelerated degradation test; pseudo-failure lifetime; reliability assessment
2014, 40(5): 140-144 收稿日期: 2014-1-23;收到修改稿日期: 2014-4-3
基金项目: 国家自然科学基金项目(61271153)
作者简介: 孙志旺(1990-),男,河北衡水市人,硕士研究生,专业方向为系统性能检测与故障诊断。
参考文献
[1] Loon D S C, Tang C. Reliability prediction using nondestructive accelerated-degradation data:case study on power supplies[J]. IEEE Transactions on Reliability,1995,44(4):562-566.
[2] Tomasi T, Lista V, Villa M. Passive optical components:from degradation data to reliability assessment[J]. Reliability of Optical Fiber Components,Devices,Systems and Networks,2003(4940):186-195.
[3] Kaczer B, Pangon N, Groeseneken G. The influence of elevated temperature on degradation and lifetime prediction of thin silicon-dioxide films[J]. IEEE Transactions on Reliability,2000,47(7):1514-1521.
[4] 孔凡志. 电磁脉冲冲击下无缘结构的瞬态点热力耦合一体化分析[D]. 上海:上海交通大学,2008.
[5] 张芳. 电子产品加速寿命试验优化设计与可靠性分析研究[D]. 石家庄:军械工程学院,2010.
[6] 方开泰,马长兴. 正交与均匀试验设计[M]. 北京:科学出版社,2001:78-80.
[7] 邓爱民,陈循,张春华,等. 基于性能退化数据的可靠性评估[J]. 宇航学报,2006(3):546-552.
[8] 峁诗松,王玲玲. 加速寿命试验[M]. 北京:科学出版社,1997:30-34.
[9] 赵宇. 可靠性数据分析[M]. 北京:国防工业出版社,2011:105-107.
[10] 胡斌. 基于反应论模型的环境因子确定方法研究[D]. 绵阳:中国工程物理研究院,2007.
[11] Yang G G. Accelerated life tests at higher usage rates[J].IEEE Transactions on reliability,2005(54):53-57.
